DocumentCode :
1908563
Title :
AlInAs/GaInAs Metal-Semiconductor-Metal photodiodes with very low dark current
Author :
Temmar, A ; Praseuth, J.P. ; Palmier, J.F. ; Scavennec, A.
Author_Institution :
Centre National d´´Etudes des Télécommunications, Laboratoire de Bagneux, 196 Avenue Henri Ravera, 92220 BAGNEUX, FRANCE
fYear :
1991
fDate :
16-19 Sept. 1991
Firstpage :
267
Lastpage :
270
Abstract :
AlInAs/GaInAs Metal-Semiconductor-Metal photodiodes have been fabricated by MBE. The structure incorporates an AlGaInAs graded region to avoid photocarrier trapping and to provide surface passivation. Low dark current and capacitance as well as good responsivity and large bandwidth have been obtained. These combined properties confirm the potential of AlInAs/GaInAs MSM detectors for long-wavelength (1.3-1.55¿m) low-noise integrated photoreceiver applications.
Keywords :
Capacitance; Dark current; Detectors; Electrodes; Leakage current; Passivation; Photodetectors; Photodiodes; Schottky barriers; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1991. ESSDERC '91. 21st European
Conference_Location :
Montreux, Switzerland
Print_ISBN :
0444890661
Type :
conf
Filename :
5435327
Link To Document :
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