Microwave antenna metrology from a single intensity scan

Two field intensity patterns are recorded at a suitable nearby location and the aperture phase recovered via the Misell phase-retrieval algorithm. A limitation of Misell-based measurements is that the antenna must be defocused for at least one of the intensity patterns. Furthermore the environmental conditions will not be identical. The total measurement and `down time´ will be greater than for holography, during which time errors may accumulate sufficiently to affect convergence to the correct solution. An antenna metrology scheme whereby the aperture distribution is recovered from a single intensity pattern is therefore most desirable