Optimum DAC and ADC Testing

DAC and ADC testing can be greatly simplified by modeling the converter, accurately measuring the parameters that are defined by the model, and generating the inl and dnl characteristics directly from the model parameters. The technique, developed many years ago for simple binary converters, is extended to segmented DACs. The method offers significant advantages with respect to reference, 1/f noise, and offset sensitivity. An algorithm that reduces the effects of measurement uncertainty is demonstrated.