Title :
Phase Noise in Time Domain ADC Testing
Author_Institution :
Fac. of Electr. Eng., Czech Tech. Univ., Prague
Abstract :
The results of ADC dynamic testing are strongly dependent on test signal purity. From this reason, the spectral purity of the most common ADC test signal, sine wave, is often improved mostly by analog filters. Such analog signal processing can essentially suppress harmonic and spurious components but not phase noise. The effects of phase noise are therefore discussed in this paper and a possible way of low-frequency phase noise suppression in the time domain is proposed and an example shown.
Keywords :
analogue-digital conversion; interference suppression; phase noise; analog filters; analog signal processing; low-frequency phase noise suppression; test signal purity; Degradation; Fluctuations; Frequency domain analysis; Harmonic distortion; Low-frequency noise; Phase distortion; Phase noise; Power harmonic filters; Signal generators; Testing; ADC testing; phase noise; sine wave fitting; time domain;
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location :
Victoria, BC
Print_ISBN :
978-1-4244-1540-3
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2008.4547103
