DocumentCode
1908660
Title
Phase Noise in Time Domain ADC Testing
Author
Slepicka, David
Author_Institution
Fac. of Electr. Eng., Czech Tech. Univ., Prague
fYear
2008
fDate
12-15 May 2008
Firstpage
579
Lastpage
582
Abstract
The results of ADC dynamic testing are strongly dependent on test signal purity. From this reason, the spectral purity of the most common ADC test signal, sine wave, is often improved mostly by analog filters. Such analog signal processing can essentially suppress harmonic and spurious components but not phase noise. The effects of phase noise are therefore discussed in this paper and a possible way of low-frequency phase noise suppression in the time domain is proposed and an example shown.
Keywords
analogue-digital conversion; interference suppression; phase noise; analog filters; analog signal processing; low-frequency phase noise suppression; test signal purity; Degradation; Fluctuations; Frequency domain analysis; Harmonic distortion; Low-frequency noise; Phase distortion; Phase noise; Power harmonic filters; Signal generators; Testing; ADC testing; phase noise; sine wave fitting; time domain;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location
Victoria, BC
ISSN
1091-5281
Print_ISBN
978-1-4244-1540-3
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2008.4547103
Filename
4547103
Link To Document