DocumentCode
1908692
Title
Time-domain measurements of transient field coupling through slots
Author
Jin, Koh Wee ; Huat, Tan Joo ; Roland, Tai Yeow Kwang ; Ernest, Kek Chew Hock
Author_Institution
DSO Nat. Lab.
fYear
2006
fDate
Feb. 27 2006-March 3 2006
Firstpage
642
Lastpage
645
Abstract
Recent advancements in the field of communications technology include the use of high speed data transmissions with extremely wide frequency bandwidth. This technology is widely employed in ultra-wideband (UWB) communication systems which can produce significant EM emissions at microwave frequencies. A key element in assessing the vulnerability of equipment to UWB signals involves an understanding on the phenomenon of transient electromagnetic energy coupling into cavity-like objects. When the wavelength of microwave sources is comparable to the size of the ports of entry (slots, apertures, seams, cracks, protruding connectors, etc.), the latter is no longer below the cut-off frequency, allowing significant amount of microwave energy to penetrate into internal susceptible electronics. In fact, these coupling paths can be highly resonating at certain microwave frequencies making EM shielding a challenging task. This paper examines the coupling effects of transient UWB signals into a rectangular shielded enclosure with two different slot sizes, through physical measurements using a time-domain technique
Keywords
electromagnetic coupling; electromagnetic shielding; time-domain analysis; ultra wideband communication; EM emissions; EM shielding; UWB communication systems; cavity-like objects; cut-off frequency; microwave frequencies; microwave sources; rectangular shielded enclosure; time-domain measurements; transient electromagnetic energy coupling; transient field coupling; ultra-wideband communication systems; Bandwidth; Communications technology; Data communication; Electromagnetic coupling; Electromagnetic transients; Microwave devices; Microwave frequencies; Microwave technology; Time domain analysis; Ultra wideband technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2006. EMC-Zurich 2006. 17th International Zurich Symposium on
Conference_Location
Singapore
Print_ISBN
3-9522990-3-0
Type
conf
DOI
10.1109/EMCZUR.2006.215016
Filename
1629706
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