DocumentCode :
1908792
Title :
Near-field photolithography by a fiber probe
Author :
Lo, Shi-Che ; Wang, Horng-Nian
fYear :
2001
fDate :
2001
Firstpage :
36
Lastpage :
39
Abstract :
Since Near-field Scanning Optical Microscopy (NSOM) was developed in 1992, many researches have been proposed to prove that it could be used in nano-fabrication because near-field optical technology can overcome the optical diffraction limit. By using near-field photolithography, we made a narrow groove (128 nm, FWHM) by an optical fiber probe with Ar+ laser (488 nm). This result shows the near-field lithography´s superiority because the linewidth is smaller than one-third wavelength (162.7 nm), and the minimal linewidth of classic optical lithography should be larger than half wavelength (244 nm)
Keywords :
fibre optic sensors; nanotechnology; near-field scanning optical microscopy; photolithography; 128 nm; 488 nm; Ar+ laser; groove linewidth; nanofabrication; near-field photolithography; near-field scanning optical microscopy; optical fiber probe; Apertures; Laser tuning; Light sources; Lithography; Optical fibers; Optical films; Optical microscopy; Probes; Resists; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2001. IEEE-NANO 2001. Proceedings of the 2001 1st IEEE Conference on
Conference_Location :
Maui, HI
Print_ISBN :
0-7803-7215-8
Type :
conf
DOI :
10.1109/NANO.2001.966389
Filename :
966389
Link To Document :
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