Title :
Micro and nano scale field electron emission properties of transition metal-fullerene compound Ti@C/sub 60/ film
Author :
Chen, J. ; Xue, K. ; An, J. ; Ke, N. ; Xu, J.B.
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, China
Abstract :
In this paper, the micro and nano scale FEE characteristics of a transition metal-fullerene compound Ti@C/sub 60/ film have been investigated, and the enhancement was discussed in term of the structural change in the Ti@C/sub 60/.
Keywords :
electron field emission; fullerenes; surface topography; thin films; titanium; FEE characteristics; Ti-C/sub 60/; microscale field electron emission properties; transition metal-fullerene compound Ti@C/sub 60/ film; Atomic force microscopy; Atomic measurements; Bonding; Copper; Electron emission; Force measurement; Rough surfaces; Substrates; Surface roughness; Surface topography;
Conference_Titel :
Vacuum Microelectronics Conference, 2003. Technical Digest of the 16th International
Conference_Location :
Osaka, Japan
Print_ISBN :
4-8181-9515-4
DOI :
10.1109/IVMC.2003.1223029
