DocumentCode :
1908901
Title :
Dynamic average method for cycle time estimator in an IC fab
Author :
Huang, Han-Pang ; Yeh, Chien-Fa ; Juang, Jia-Yang ; Lin, Li-Ren ; Chen, Thomas
Author_Institution :
Dept. of Mech. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
1998
fDate :
16-17 Jun 1998
Firstpage :
71
Lastpage :
74
Abstract :
The forecast of process cycle time is difficult in an IC manufacturing system, especially in an environment with multiple products and various processes. In this paper, a simple forecast mechanism is developed to provide the forecast of a product´s cycle time and product´s remaining process cycle time, and other useful processing information. The proposed algorithm is based on a dynamic average of historical process data stored in a database to generate runtime, wait-time and hold-time information, and the results are further classified in terms of tool group (or tool), technology and stage-ID hierarchically. The product´s remaining process cycle time can be obtained by looking for the product´s state from on-line data in the database first, and then utilizing the product´s operation flow table and the average process time given above to calculate it. For calculating product´s cycle time, it works in a similar way. Since the run-time, wait-time and hold-time of each lot can be shown from the proposed algorithm, it is easy to forecast the operation bottleneck of the lot. This method is proved to be useful by testing in Fab 3 of TSMC (Taiwan Semiconductor Manufacturing Company)
Keywords :
electronic engineering computing; integrated circuit manufacture; production control; production engineering computing; IC fab; IC manufacturing system; average process time; cycle time estimator; dynamic average method; historical process data; operation flow table; process cycle time; process cycle time forecasting; Companies; Databases; Foundries; Laboratories; Manufacturing systems; Mechanical engineering; Robots; Runtime; Semiconductor device manufacture; Semiconductor device testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Technology Workshop, 1998
Conference_Location :
Hsinchu
Print_ISBN :
0-7803-5179-7
Type :
conf
DOI :
10.1109/SMTW.1998.722656
Filename :
722656
Link To Document :
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