مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1909276

Title :

Technical papers

fYear :

2007

fDate :

22-25 Jan. 2007

Keywords :

Cause effect analysis; Cost benefit analysis; Failure analysis; Integrated circuit modeling; Life estimation; Materials reliability; Pattern analysis; Performance analysis; Predictive models; Risk analysis;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Reliability and Maintainability Symposium, 2007. RAMS '07. Annual

Conference_Location :

Orlando, FL

ISSN :

0149-144X

Print_ISBN :

0-7803-9766-5

Electronic_ISBN :

0149-144X

Type :

conf

DOI :

10.1109/RAMS.2007.328041

Filename :

4126314

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1909276