DocumentCode
1909276
Title
Technical papers
fYear
2007
fDate
22-25 Jan. 2007
Keywords
Cause effect analysis; Cost benefit analysis; Failure analysis; Integrated circuit modeling; Life estimation; Materials reliability; Pattern analysis; Performance analysis; Predictive models; Risk analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2007. RAMS '07. Annual
Conference_Location
Orlando, FL
ISSN
0149-144X
Print_ISBN
0-7803-9766-5
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2007.328041
Filename
4126314
Link To Document