DocumentCode
1909474
Title
Modeling and optimization of extended warranties using probabilistic design
Author
Vittal, Sameer ; Phillips, Randolph
Author_Institution
Div. of Energy, General Electr. Co., SC
fYear
2007
fDate
22-25 Jan. 2007
Firstpage
41
Lastpage
47
Abstract
Reliability engineers and actuaries from the insurance industry are increasingly being asked to collaborate in measuring, valuing and managing risk associated with extended warranties and long term service agreements. This interaction has resulted in the development of hybrid approaches that combine methods of quantifying uncertainty in the engineering domain (probabilistic design algorithms) with models that incorporate financial risk and uncertainty (actuarial loss models). One such hybrid algorithm is described in this paper. In this approach, the reliability of a structure is computed using a analytic, time-dependent stochastic-degradation code and its long term risk is assessed using a combination of renewal and actuarial loss models. Using these techniques, products can be optimally designed to meet an acceptable probability of survival as well as a predetermined cap on probabilistic financial exposure. The methods presented in this paper can also be used to value extended warranties. The algorithm and its potential applications are illustrated through a representative case study.
Keywords
design of experiments; financial management; optimisation; reliability; risk management; service industries; extended warranties; financial risk; insurance industry; long term service agreements; probabilistic design; probabilistic design algorithms; probabilistic financial exposure; reliability engineers; risk management; time-dependent stochastic-degradation code; Algorithm design and analysis; Collaboration; Design engineering; Design optimization; Engineering management; Insurance; Reliability engineering; Risk analysis; Risk management; Warranties;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2007. RAMS '07. Annual
Conference_Location
Orlando, FL
ISSN
0149-144X
Print_ISBN
0-7803-9766-5
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2007.328045
Filename
4126322
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