DocumentCode
1909481
Title
Dynamic laser beam testing of a n-MOS device
Author
Bergner, H. ; Hempel, K. ; Krause, A. ; Stamm, U.
Author_Institution
Friedrich Schiller University Jena, Faculty of Physics and Astronomy, Institute of Optics and Quantum Electronics, Max-Wien-Platz 1, O-6900 Jena, FRG
fYear
1991
fDate
16-19 Sept. 1991
Firstpage
109
Lastpage
112
Abstract
An IC consisting of a n-MOS inverter chain was investigated with the time-resolved OBIC method. The temporal shape of the electrical response to a 100 ps laser pulse and the propagation of the generated electrical pulse in the chain was studied.
Keywords
Inverters; Laser beams; Laser excitation; Laser mode locking; Laser theory; Optical beams; Optical modulation; Optical pulse generation; Probes; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1991. ESSDERC '91. 21st European
Conference_Location
Montreux, Switzerland
Print_ISBN
0444890661
Type
conf
Filename
5435361
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