DocumentCode
1909636
Title
Towards realization of a high-fidelity simulation model for short-term horizon forecasting in wafer fabrication facilities
Author
Scholl, Wolfgang ; Gan, Boon Ping ; Peh, Ming Li ; Lendermann, Peter ; Noack, Daniel ; Rose, Oliver ; Preuss, Patrick
Author_Institution
Infineon Technol. Dresden, Dresden, Germany
fYear
2010
fDate
5-8 Dec. 2010
Firstpage
2563
Lastpage
2574
Abstract
Discrete Event Simulation (DES) has widely been used for mid and long term forecasting in wafer fabrication plants. But the use of DES for short term forecasting has been limited due to the perceived modelling and computation complexity as well as the non-steady state nature of today´s wafer fab operations. In this paper, we discuss some important modelling issues associated with building an online simulation model. Key elements considered are actual process routes, process and throughput modelling as a function of equipment behavior, lot size, and available processing modules, process dedication at equipment level, equipment downs at mainframe level, estimated lot release strategy, send ahead wafers, dispatch rules, and setup. Typical application areas are proactive dedication management, preventive maintenance scheduling and WIP based sampling optimization.
Keywords
computational complexity; discrete event simulation; forecasting theory; production engineering computing; semiconductor industry; wafer level packaging; WIP; actual process routes; computation complexity; discrete event simulation; high-fidelity simulation model; nonsteady state; online simulation model; preventive maintenance scheduling; proactive dedication management; process modelling; sampling optimization; short term horizon forecasting; throughput modelling; wafer fabrication plant; Analytical models; Computational modeling; Data models; Predictive models; Production; Semiconductor device modeling; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference (WSC), Proceedings of the 2010 Winter
Conference_Location
Baltimore, MD
ISSN
0891-7736
Print_ISBN
978-1-4244-9866-6
Type
conf
DOI
10.1109/WSC.2010.5678952
Filename
5678952
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