• DocumentCode
    1909710
  • Title

    A Markov Decision Process model for optimal policy making in the maintenance of a single-machine single-product toolset

  • Author

    Borrero, Juan Sebastián ; Akhavan-Tabatabaei, Raha

  • Author_Institution
    Univ. de los Andes, Bogota, Colombia
  • fYear
    2010
  • fDate
    5-8 Dec. 2010
  • Firstpage
    2594
  • Lastpage
    2605
  • Abstract
    An aspect of great importance in Semiconductor Manufacturing Systems (SMS) is that machines are subject to unpredictable failures. Since Semiconductor Manufacturing is a highly capital intensive industry, it is crucial to optimize the usage of the resources. Performing preventive maintenance (PM), if done optimally, can reduce the risk of unpredicted failures and hence minimize the cost of outages. However, performing frequent PM results in higher cycle time and WIP accumulation at the toolset. In this paper we present a method to create optimal policies for a single-server single-product workstation using a Markov Decision Process model. The optimal policy determines whether or not to perform the PM based on the WIP level and the time since last repair. We present some numerical examples to illustrate the behavior of the optimal policy under different scenarios and compare the results with some common policies such as fixed frequency PM.
  • Keywords
    Markov processes; maintenance engineering; manufacturing systems; semiconductor device manufacture; semiconductor industry; Markov decision process model; PM; SMS; intensive industry; optimal policy making; preventive maintenance; semiconductor manufacturing systems; single-machine single-product toolset; Analytical models; Manufacturing systems; Markov processes; Preventive maintenance; Random variables; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), Proceedings of the 2010 Winter
  • Conference_Location
    Baltimore, MD
  • ISSN
    0891-7736
  • Print_ISBN
    978-1-4244-9866-6
  • Type

    conf

  • DOI
    10.1109/WSC.2010.5678955
  • Filename
    5678955