Title :
A CCD delay line to determine low concentrations of bulk traps in silicon
Author :
Toren, W.J. ; Bisschop, J.
Author_Institution :
Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands.
Keywords :
Charge coupled devices; Charge measurement; Clocks; Contamination; Current measurement; Delay lines; Electron traps; Loss measurement; Pollution measurement; Silicon;
Conference_Titel :
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Conference_Location :
Leuven, Belgium
