• DocumentCode
    1910034
  • Title

    Straddle-board modeling of SMT joint behaviors

  • Author

    Kilinski, Thomas J. ; Goetsch, Daniel P. ; Sandor, Bela I.

  • Author_Institution
    Dept. of Eng. Math., Wisconsin Univ., Madison, WI, USA
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    981
  • Abstract
    Straddle-board specimens consisting of a chip carrier connected by J-leads to a printed wiring board were tested isothermally at room temperature. Thermal expansions were simulated by controlling the deflection of the bisectioned printed wiring board. Initial results are presented from using the straddle-board configuration for material response and fatigue life analysis of actual surface-mounted joints. The leads were subjected to two typical extreme modes of deformation, longitudinal and transverse deflections, to determine the behaviors and damage in each case. It was found that the transverse component of the lead deflection, which increases in magnitude toward the corner of the chip carrier, is more damaging than the longitudinal component, which does not vary from lead to lead. The fatigue data, plotted as percent load drop versus cycles, follows a linear pattern during the initial stages of damage. The effects of stress relaxation on the rate of loading show a logarithmic correlation with deflection
  • Keywords
    deformation; fatigue; modelling; printed circuits; soldering; surface mount technology; thermal expansion; thermal stress cracking; J-leads; PWB mounted SMD; SMT joint behaviors; chip carrier; deformation; fatigue life analysis; isothermal testing; lead deflection; loading rate; longitudinal component; material response; printed wiring board; room temperature; straddle-board configuration; stress relaxation; surface-mounted joints; transverse deflections; Fatigue; Lead; Performance evaluation; Predictive models; Soldering; Surface-mount technology; Temperature; Testing; Thermal expansion; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122307
  • Filename
    122307