DocumentCode :
1910051
Title :
Wavelet-Based Compressed Sensing Using Low Frequency Coefficients
Author :
Binbing Li ; Zhizhen Zhu ; Falin Liu ; Zhida Zhang ; Chongbin Zhou
Author_Institution :
Dept. of Electron. Eng. & Inf. Sci., Univ. of Sci. & Technol. of China, Hefei, China
fYear :
2012
fDate :
14-16 Dec. 2012
Firstpage :
119
Lastpage :
123
Abstract :
Signal models such as wavelet trees, block sparsity and statistical models are integrated into compressed sensing (CS) recovery algorithms in order to improve recovery accuracy and decrease the number of measurements. However, there are many constraints in practical applications. This paper introduces a new simple and efficient model based on the fact that low frequency coefficients are more important than others in wavelet domain. Furthermore, a degradation algorithm is designed to convert two-dimensional images to one-dimensional signals. This process makes the representations of images more sparse under a fixed wavelet basis. The proposed model and the degradation algorithm are successfully incorporated into two CS algorithms, including iteratively reweighted l1 minimization (IRL1) and iterative hard thresholding (IHT). Extensive experiments demonstrate that the proposed algorithms are significantly effective to improve recovery accuracy.
Keywords :
compressed sensing; data compression; image coding; image representation; iterative methods; statistical analysis; trees (mathematics); wavelet transforms; 1D signal; 2D image; IHT; IRL1; block sparsity; compressed sensing recovery algorithm; degradation algorithm; fixed wavelet basis; image representation; iterative hard thresholding; iteratively reweighted l1 minimization; low frequency coefficient; recovery accuracy; signal model; statistical model; wavelet domain; wavelet trees; wavelet-based compressed sensing; Compressed sensing (CS); Degradation; Low frequency coefficients (LFC);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Science and Engineering (ISISE), 2012 International Symposium on
Conference_Location :
Shanghai
ISSN :
2160-1283
Print_ISBN :
978-1-4673-5680-0
Type :
conf
DOI :
10.1109/ISISE.2012.34
Filename :
6495310
Link To Document :
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