DocumentCode :
1910167
Title :
TCAD assessment of nonconventional Dual Insulator Double Gate MOSFET
Author :
Yadav, Shekhar ; Srivastava, Anurag ; Rahul, Jagdeep ; Jha, Kamal Kishor
Author_Institution :
VLSI Design Lab., Comput. Nanosci. & Technol. Lab., ABV-Indian Inst. of Inf. Technol. & Manage., Gwalior, India
fYear :
2012
fDate :
15-16 March 2012
Firstpage :
462
Lastpage :
465
Abstract :
In the present work we have introduced generic new type of Double Gate Metal Oxide Semiconductor Field Effect Transistor (DG MOSFET), with Dual Insulator (DI) architecture. The gate insulator of the Dual Insulator Double Gate (DIDG) MOSFET consists of two laterally placed insulator materials with different dielectric constants. This novel gate insulator structure takes advantage of difference of dielectric constants in such a way that the threshold voltage near the source is more positive than that near the drain (for n-channel DIDG MOSFET, opposite for p-channel DIDG MOSFET), resulting in a more rapid acceleration of charge carriers in the channel near the source and a screening effect near drain region of channel due to which device shows significant suppression in the drain conductance and a higher drain current than conventional Double Gate MOSFET.
Keywords :
MOSFET; electronic engineering computing; permittivity; technology CAD (electronics); DI architecture; TCAD assessment; charge carrier acceleration; dielectric constants; drain conductance suppression; gate insulator structure; insulator materials; metal oxide semiconductor field effect transistor; n-channel DIDG MOSFET; nonconventional dual insulator double gate MOSFET architecture; p-channel DIDG MOSFET; screening effect; threshold voltage; Dielectrics; Hafnium compounds; Insulators; Logic gates; MOSFET circuits; Substrates; ATLAS devise simulator; DIDG MOSFET; Dielectric constants; Drain conductance; Gate insulator; Gate to channel capacitance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Devices, Circuits and Systems (ICDCS), 2012 International Conference on
Conference_Location :
Coimbatore
Print_ISBN :
978-1-4577-1545-7
Type :
conf
DOI :
10.1109/ICDCSyst.2012.6188757
Filename :
6188757
Link To Document :
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