DocumentCode
1910238
Title
Small geometry effects on the maximum cutoff frequency of bipolar transistors
Author
Decoutere, S. ; Deferm, L.
Author_Institution
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
fYear
1992
fDate
14-17 Sept. 1992
Firstpage
707
Lastpage
710
Abstract
Small geometry effects on the maximum cutoff frequency will be theoretically analysed to provide a base for the physical understanding of the cutoff frequency degradation by peripheral effects. The study is based on a detailed analysis of the time delay components.
Keywords
Analytical models; Bipolar transistors; Capacitance; Cutoff frequency; Degradation; Delay effects; Equations; Geometry; Microelectronics; Semiconductor process modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Conference_Location
Leuven, Belgium
Print_ISBN
0444894780
Type
conf
Filename
5435390
Link To Document