DocumentCode
1910496
Title
Efficient Reliability Predictions of Particle-Induced Failures in HDDs
Author
Tang, Loon-Ching ; Lam, Shao-Wei ; Ng, Quock-Y ; Goh, Jing-Shi
Author_Institution
Nat. Univ. of Singapore
fYear
2007
fDate
22-25 Jan. 2007
Firstpage
259
Lastpage
264
Abstract
In this paper, an experimental set-up as well as the modeling framework for efficient prediction of hard disks (HDD) reliability due to particle-induced failure within the product development process (PDP) is proposed. An alternative response using the cumulative particle counts (CPC), whose failure distribution can be modeled by the lognormal distribution, is introduced in the modeling framework. By using a model to describe the growth of CPC in prime HDDs based on data from the same vintage, the lifetime distribution of particle-induced failure for the HDDs can be obtained. Prime HDDs are fully functional drives within a typical HDD product development process. For illustration, five prime HDDs from a same vintage of a HDD family are used to determine the baseline CPC growth over a certain period of time. The lifetime distribution is then derived for that vintage of HDDs
Keywords
disc drives; failure (mechanical); hard discs; product development; reliability; HDD; cumulative particle counts; lifetime distribution; lognormal distribution; particle-induced failure; particle-induced failures; product development process; reliability predictions; Contamination; Data analysis; Failure analysis; Hard disks; Life estimation; Life testing; Magnetic memory; Manufacturing processes; Predictive models; Product development;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2007. RAMS '07. Annual
Conference_Location
Orlando, FL
ISSN
0149-144X
Print_ISBN
0-7803-9766-5
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2007.328064
Filename
4126360
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