• DocumentCode
    1910643
  • Title

    Four BIT CMOS full adder in submicron technology with low leakage and Ground bounce noise reduction

  • Author

    Jayashree, H.V. ; Harsha, K.

  • Author_Institution
    PES Inst. of Technol., Bangalore, India
  • fYear
    2012
  • fDate
    15-16 March 2012
  • Firstpage
    20
  • Lastpage
    24
  • Abstract
    For the design and analysis of complex arithmetic circuits, Ground bounce noise is given an equal importance in the list of low power performance measuring parameters like leakage current, active power, delay and area. In this paper leakage power and the ground bounce noise is considerably reduced by the use of sleep transistor in full adder design. Size of the sleep transistor is determined by transistor resizing approach. 4 bit adder is implemented using 1 bit adder as reference. The simulation shows that, the 1 bit and 4 bit adders are efficient in terms of standby leakage power, active power and ground bounce noise. Simulations have been performed using T-Spice 90nm and 65nm CMOS technology with supply voltage of 5v and 3.3v at room temperature.
  • Keywords
    CMOS integrated circuits; adders; digital arithmetic; transistor circuits; CMOS full adder; CMOS technology; T-Spice; complex arithmetic circuits; ground bounce noise reduction; room temperature; size 65 nm; size 90 nm; sleep transistor; standby leakage power; submicron technology; temperature 293 K to 298 K; voltage 3.3 V; voltage 5 V; word length 1 bit; word length 4 bit; CMOS technology; MOS devices; Optimization; Robustness; Switching circuits; Transistors; Very large scale integration; Ground Bounce; Low leakage power; Sleep transistor; adder cell;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Devices, Circuits and Systems (ICDCS), 2012 International Conference on
  • Conference_Location
    Coimbatore
  • Print_ISBN
    978-1-4577-1545-7
  • Type

    conf

  • DOI
    10.1109/ICDCSyst.2012.6188780
  • Filename
    6188780