Title :
Modeling buffer layer IGBTs for circuit simulation
Author :
Hefner, Allen R., Jr.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
The dynamic behavior of commercially available buffer layer insulated gate bipolar transistors (IGBTs) is described. It is shown that buffer layer IGBTs become much faster at high voltages than nonbuffer layer IGBTs with similar low voltage characteristics. Because the fall times specified in manufacturers´ data sheets do not reflect the voltage dependence of switching speed, a new method of selecting devices for different circuit applications is suggested. A buffer layer IGBT model is developed and implemented into the Saber circuit simulator, and a procedure is developed to extract the model parameters for buffer layer IGBTs. It is shown that the new buffer layer IGBT model can be used to describe the dynamic behavior and power dissipation of buffer layer IGBTs in user-defined application circuits. The results of the buffer layer IGBT model are verified using commercially available IGBTs
Keywords :
circuit analysis computing; digital simulation; insulated gate bipolar transistors; power semiconductor switches; semiconductor device models; switching circuits; IGBT; Saber circuit simulator; buffer layer insulated gate bipolar transistors; circuit simulation; dynamic behavior; low voltage characteristics; power dissipation; switching speed; voltage dependence; Bipolar transistors; Buffer layers; Circuit simulation; Insulated gate bipolar transistors; MOSFET circuits; NIST; Power semiconductor switches; Semiconductor device manufacture; Switching circuits; Voltage;
Conference_Titel :
Power Electronics Specialists Conference, 1993. PESC '93 Record., 24th Annual IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-1243-0
DOI :
10.1109/PESC.1993.471936