• DocumentCode
    1910995
  • Title

    Dynamic floating body effects in PD SOI MOSFETs biased in the kink region

  • Author

    Perron, L. ; Hamaguchi, C. ; Lacaita, A. ; Maegewa, M. ; Yamaguchi, Y.

  • Author_Institution
    Osaka University, Japan and Politecnico di Milano Italy
  • fYear
    1997
  • fDate
    22-24 September 1997
  • Firstpage
    524
  • Lastpage
    527
  • Keywords
    Impact ionization; Leakage current; MOSFET circuits; Semiconductor films; Silicon; Steady-state; Substrates; Switches; Switching frequency; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  • Print_ISBN
    2-86332-221-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.1997.194481
  • Filename
    1503411