Title :
Low frequency 1/f noise characterization of advanced CMOS-compatible bipolar junction transistors for technology evaluation
Author :
Llinares, P. ; Niel, S. ; Laurens, M. ; Ghibaudo, G. ; Chroboczek, J.A.
Author_Institution :
France Telecom - CNET, France and SGS-Thomson, France
fDate :
22-24 September 1997
Keywords :
CMOS technology; Degradation; Frequency; Low-frequency noise; Noise figure; Noise level; Noise reduction; Secondary generated hot electron injection; Surface cleaning; Transistors;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194483
