DocumentCode :
1911102
Title :
Interface Properties of Strained InGaAs/InP Quantum Wells Grown by LP-MOVPE
Author :
Schwedler, R. ; Gallmann, B. ; Wolter, K. ; Kohl, A. ; Leo, K. ; Kurz, H. ; Juillaguet, S. ; Camassel, J. ; Laurenti, J.P. ; Baumann, F.H.
Author_Institution :
Institute of Semiconductor Electronics, RWTH Aachen, FRG
fYear :
1992
fDate :
14-17 Sept. 1992
Firstpage :
891
Lastpage :
894
Abstract :
We have analysed ultrathin (5-10 monolayers) In1-xGaxAs/InP (0.17 ¿ x ¿ 1) quantum wells grown by low-pressure metal organic vapour phase epitaxy using optical spectroscopy and transmission electron microscopy. We find, for all compositions, evidence for a complex interface structure at both the lower and the upper interface. Both originate from interdiffusion of arsenic and phosphorus at growth time. The influence of the interface structure on the optical transition energies is discussed in detail.
Keywords :
Electron optics; Epitaxial growth; Geographic Information Systems; Indium gallium arsenide; Indium phosphide; Lattices; Multilevel systems; Optical microscopy; Quantum well devices; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Conference_Location :
Leuven, Belgium
Print_ISBN :
0444894780
Type :
conf
Filename :
5435429
Link To Document :
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