DocumentCode :
1911176
Title :
Time to Failure Behavior under a Stochastic Deterioration Model
Author :
Xiang, Yisha ; Cassady, C.R.
fYear :
2007
fDate :
22-25 Jan. 2007
Firstpage :
405
Lastpage :
409
Abstract :
The objective of our study is to investigate the potential for approximating the time to first failure distributions resulting from stochastic deterioration models with traditional time to failure distributions (e.g., the Weibull). We first constructed a discrete-event simulation model that mimics the stochastic deterioration and failure of the system of interest: a single-unit system subject to a random operating environment such that its instantaneous rate of degradation depends on the state of the environment. The state of the environment is modeled as a continuous-time Markov Chain. A methodology is then defined for fitting a traditional time to failure distribution to the simulated data. A large numerical experiment is used to evaluate the quality of this fit under a wide range of system parameters. The goodness-fit tests results show that a truncated, three-parameter Weibull distribution is a reasonable estimate for the case described in the paper.
Keywords :
Markov processes; Weibull distribution; failure analysis; Weibull distribution; continuous-time Markov Chain; discrete-event simulation model; failure distributions; goodness-fit tests; stochastic deterioration model; time to failure behavior; Degradation; Job shop scheduling; Mathematical model; Physics; Predictive maintenance; Predictive models; Preventive maintenance; Sensor systems; Stochastic processes; Stochastic systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2007. RAMS '07. Annual
Conference_Location :
Orlando, FL
ISSN :
0149-144X
Print_ISBN :
0-7803-9766-5
Electronic_ISBN :
0149-144X
Type :
conf
DOI :
10.1109/RAMS.2007.328108
Filename :
4126385
Link To Document :
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