DocumentCode
1911188
Title
Microplasma and Uniform Gate Breakdown in MESFETs
Author
Vashchenko, V.A. ; Martynov, Y.B. ; Sinkevitch, V.F.
Author_Institution
State Research Institute "Pulsar", Moscow
fYear
1997
fDate
22-24 September 1997
Firstpage
552
Lastpage
555
Keywords
Conductivity; Current distribution; Electric breakdown; Gallium arsenide; Hysteresis; MESFETs; Numerical simulation; Power generation; Region 8; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN
2-86332-221-4
Type
conf
DOI
10.1109/ESSDERC.1997.194488
Filename
1503418
Link To Document