• DocumentCode
    1911289
  • Title

    The impact of the S/D extensions on the drain current characteristics of deep submicron Si nMOSFETs at 77 K

  • Author

    Biesemans, S. ; Simoen, E. ; Kubicek, S. ; De Meyer, K. ; Claeys, C.

  • Author_Institution
    IMEC, Belgium
  • fYear
    1997
  • fDate
    22-24 September 1997
  • Firstpage
    564
  • Lastpage
    567
  • Keywords
    Application specific processors; CMOS technology; Cryogenic electronics; Electronics cooling; Implants; Intrusion detection; MOSFETs; Packaging; Performance evaluation; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  • Print_ISBN
    2-86332-221-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.1997.194491
  • Filename
    1503421
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1911289