• DocumentCode
    1911399
  • Title

    Effects of high temperature on performances and hot-carrier reliability in DC/AC stressed 0.35 um n-MOSFETs

  • Author

    Bravaix, A. ; Goguenheim, D. ; Revil, N. ; Varrot, M. ; Mortini, P.

  • Author_Institution
    ISEM, Maison des technologies, France
  • fYear
    1997
  • fDate
    22-24 September 1997
  • Firstpage
    584
  • Lastpage
    587
  • Keywords
    CMOS technology; Degradation; Electron traps; Hot carrier effects; Hot carriers; MOSFET circuits; Microelectronics; Stress; Temperature distribution; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  • Print_ISBN
    2-86332-221-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.1997.194496
  • Filename
    1503426
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1911399