DocumentCode
191146
Title
Wideband characterization of dielectric material by new approaches based on near field microwave microscopy
Author
Jamal, Rammal ; Olivier, Tantot ; Nicolas, Delhote ; Serge, Verdeyme
Author_Institution
XLIM, Univ. of Limoges, Albert, France
fYear
2014
fDate
6-9 Oct. 2014
Firstpage
116
Lastpage
119
Abstract
We present in this paper an electromagnetic model based on finite elements method for the characterization of dielectric samples with a near field microwave microscopy, this proposed model is a useful tool to determine for, a given microcopy probe, the minimum substrate thickness required to extract accurately the substrate relative permittivity and loss tangent. This paper proposes a practical application with a wideband characterization apparatus.
Keywords
dielectric losses; dielectric materials; finite element analysis; dielectric material; electromagnetic model; finite elements method; loss tangent; near field microwave microscopy; relative permittivity; wideband characterization apparatus; Frequency measurement; Materials; Microwave theory and techniques; Permittivity; Permittivity measurement; Probes; Resonant frequency; Characterization; Electromagnetic model; Materials; Near field; wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (EuMC), 2014 44th European
Conference_Location
Rome
Type
conf
DOI
10.1109/EuMC.2014.6986383
Filename
6986383
Link To Document