Title :
Wideband characterization of dielectric material by new approaches based on near field microwave microscopy
Author :
Jamal, Rammal ; Olivier, Tantot ; Nicolas, Delhote ; Serge, Verdeyme
Author_Institution :
XLIM, Univ. of Limoges, Albert, France
Abstract :
We present in this paper an electromagnetic model based on finite elements method for the characterization of dielectric samples with a near field microwave microscopy, this proposed model is a useful tool to determine for, a given microcopy probe, the minimum substrate thickness required to extract accurately the substrate relative permittivity and loss tangent. This paper proposes a practical application with a wideband characterization apparatus.
Keywords :
dielectric losses; dielectric materials; finite element analysis; dielectric material; electromagnetic model; finite elements method; loss tangent; near field microwave microscopy; relative permittivity; wideband characterization apparatus; Frequency measurement; Materials; Microwave theory and techniques; Permittivity; Permittivity measurement; Probes; Resonant frequency; Characterization; Electromagnetic model; Materials; Near field; wideband;
Conference_Titel :
Microwave Conference (EuMC), 2014 44th European
Conference_Location :
Rome
DOI :
10.1109/EuMC.2014.6986383
