• DocumentCode
    1912103
  • Title

    Solder-glass attachment in Cerdip/Cerquad packages: thermally induced stresses and mechanical reliability

  • Author

    Suhir, E. ; Poborets, B.

  • Author_Institution
    AT&T Bell Lab., Murray Hill, NJ, USA
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    1043
  • Abstract
    The authors discuss the major requirements for the mechanical properties of solder glasses and ceramics in cerquad flat packages (CQFP) and develop a simple and easy-to-use stress-evaluation model aimed at assessing thermal stresses in the glass seals of ceramic packages. The authors also demonstrate how a probabilistic approach can be applied to ensure low and compressive stresses in the glass seals, and describe the results of qualification tests for the CQFP packages. For a reliable solder glass seal in a hermetic ceramic package, it is recommended that the same material be used for all the ceramic components and that the coefficient of thermal expansion of this material be close and somewhat larger than the coefficient of thermal expansion of the solder glass, especially at low temperatures, when the expected thermally induced stresses are the greatest. It is also important that the sealing be performed at the lowest possible temperature and that the solder glass material possess high fracture toughness, high strain-to-failure, good shock resistance, low Young´s modulus, and good adhesion with ceramics
  • Keywords
    packaging; reliability; seals (stoppers); soldering; thermal stresses; Cerdip/Cerquad packages; Young´s modulus; adhesion; ceramics; coefficient of thermal expansion; compressive stresses; fracture toughness; glass seals; hermetic ceramic package; mechanical properties; mechanical reliability; qualification tests; sealing; shock resistance; solder glasses; strain-to-failure; stress-evaluation model; thermally induced stresses; Ceramics; Compressive stress; Glass; Mechanical factors; Packaging; Sealing materials; Seals; Temperature; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122315
  • Filename
    122315