DocumentCode :
1912411
Title :
A general purpose 1149.4 IC with HF analog test capabilities
Author :
Sunter, Stephen ; Filliter, Ken ; Joe, W. ; McHugh, Pat
fYear :
2001
fDate :
2001
Firstpage :
38
Lastpage :
45
Abstract :
This paper describes a general purpose IC intended for improving the testability of mixed-signal circuit boards and for investigating enhancements to the IEEE 1149.4 mixed-signal test bus. The 20-pin IC makes it possible to measure the impedance of 9 board-level circuit nodes via a 2-wire analog bus, and to monitor high frequency signals (HF>10 MHz) in continuous or sampled time. The IC design, performance trade-offs, and measured performance are discussed. Impedance measurement accuracy (±5 ohms for first samples) was shown to be limited primarily by function pin series resistance RCOM; a simple technique for measuring its value is described. Lastly, results for a demonstration circuit board, and software available from many vendors, are presented
Keywords :
IEEE standards; electric impedance measurement; electric resistance; field buses; integrated circuit design; integrated circuit measurement; mixed analogue-digital integrated circuits; printed circuit testing; 10 MHz; HF analog test capabilities; IC design; IC performance trade-offs; IEEE 1149.4 mixed-signal test bus; analog bus; board-level circuit nodes; continuous time monitoring; demonstration circuit board; function pin series resistance; general purpose IEEE 1149.4 IC; high frequency signal monitoring; impedance; impedance measurement accuracy; measured IC performance; mixed-signal circuit boards; sampled time monitoring; testability; Analog integrated circuits; Circuit testing; Electrical resistance measurement; Frequency measurement; Hafnium; Impedance measurement; Integrated circuit testing; Monitoring; Printed circuits; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
ISSN :
1089-3539
Print_ISBN :
0-7803-7169-0
Type :
conf
DOI :
10.1109/TEST.2001.966616
Filename :
966616
Link To Document :
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