• DocumentCode
    1912411
  • Title

    A general purpose 1149.4 IC with HF analog test capabilities

  • Author

    Sunter, Stephen ; Filliter, Ken ; Joe, W. ; McHugh, Pat

  • fYear
    2001
  • fDate
    2001
  • Firstpage
    38
  • Lastpage
    45
  • Abstract
    This paper describes a general purpose IC intended for improving the testability of mixed-signal circuit boards and for investigating enhancements to the IEEE 1149.4 mixed-signal test bus. The 20-pin IC makes it possible to measure the impedance of 9 board-level circuit nodes via a 2-wire analog bus, and to monitor high frequency signals (HF>10 MHz) in continuous or sampled time. The IC design, performance trade-offs, and measured performance are discussed. Impedance measurement accuracy (±5 ohms for first samples) was shown to be limited primarily by function pin series resistance RCOM; a simple technique for measuring its value is described. Lastly, results for a demonstration circuit board, and software available from many vendors, are presented
  • Keywords
    IEEE standards; electric impedance measurement; electric resistance; field buses; integrated circuit design; integrated circuit measurement; mixed analogue-digital integrated circuits; printed circuit testing; 10 MHz; HF analog test capabilities; IC design; IC performance trade-offs; IEEE 1149.4 mixed-signal test bus; analog bus; board-level circuit nodes; continuous time monitoring; demonstration circuit board; function pin series resistance; general purpose IEEE 1149.4 IC; high frequency signal monitoring; impedance; impedance measurement accuracy; measured IC performance; mixed-signal circuit boards; sampled time monitoring; testability; Analog integrated circuits; Circuit testing; Electrical resistance measurement; Frequency measurement; Hafnium; Impedance measurement; Integrated circuit testing; Monitoring; Printed circuits; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2001. Proceedings. International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7169-0
  • Type

    conf

  • DOI
    10.1109/TEST.2001.966616
  • Filename
    966616