Title :
Frequency detection-based boundary-scan testing of AC coupled nets
Author :
Kim, Young ; Lai, Benny ; Parker, Kenneth P. ; Rearick, Jeff
Author_Institution :
Agilent Technol., San Jose, CA, USA
Abstract :
The use of AC coupling capacitors on high-speed interconnects prevents the use of traditional DC-based boundary-scan techniques to test for board manufacturing defects. A solution is provided by a novel scheme that makes use of frequency discrimination using simple digital circuits that are easily integrated with the 1149.1 boundary-scan standard. Simulation results are presented which show the effectiveness of this method, and its robustness and scalability are compared with alternative solutions
Keywords :
IEEE standards; boundary scan testing; capacitors; circuit simulation; integrated circuit interconnections; printed circuit testing; AC coupled nets; AC coupling capacitors; DC-based boundary-scan techniques; IEEE 1149.1 boundary-scan standard; board manufacturing defects; board test; digital circuits; frequency detection-based boundary-scan testing; frequency discrimination; high-speed interconnects; method robustness; method scalability; simulation; Capacitors; Circuit simulation; Circuit testing; Coupling circuits; Digital circuits; Frequency; Integrated circuit interconnections; Manufacturing; Robustness; Scalability;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966617
