Title :
Remote access to engineering test-a case study in providing engineering/diagnostic IC test services to Canadian universities
Author :
Stevenson, Robert L.
Author_Institution :
Canadian Microelectron. Corp., Kingston, Ont.
Abstract :
Networked access to high-performance test laboratories is a viable and economically attractive alternative for ´engineering test´ of custom integrated circuits. This paper presents a case study of the implementation of such a system and results of its usage
Keywords :
application specific integrated circuits; automatic test equipment; automatic test software; educational computing; electronic engineering computing; electronic engineering education; integrated circuit testing; Canadian universities; IC manufacturing technologies; custom integrated circuits; engineering test; engineering/diagnostic IC test services; high-performance test laboratories; networked access; remote engineering test access; Circuit testing; Computer aided software engineering; Costs; Educational institutions; Integrated circuit technology; Integrated circuit testing; Laboratories; Manufacturing; Microelectronics; System testing;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966629
