Title :
An Improved Method for the Automatic Digital Modulation Classification
Author :
Vito, LucaDe ; Rapuano, Sergio ; Villanacci, Maurizio
Author_Institution :
Dept. of Eng., Sannio Univ., Benevento
Abstract :
In this paper, a new method for the automatic modulation classification of an unknown signal, working without any knowledge about the modulation parameters, is proposed. The method has been developed in two different versions, such that it can be implemented on both waveform digitizers and vector signal analyzers. The developed method is able to recognize classical single carrier modulations such as M-ary phase-shift keying (PSK), M-ary frequency shift keying (FSK), M-ary amplitude shift keying (ASK), and M-ary quadrature amplitude modulation (QAM), as well as orthogonal drequency division multiplexing modulations (OFDM) such as the discrete multitone (DMT). Both the versions of the new developed method are able to work with limited-bandwidth signals, too. After the identification of the modulation type, the method automatically estimates some parameters characterizing the modulation. In order to evaluate the method performance, several experimental tests, with simulated and actual signals, have been carried out in different operating conditions by varying the Signal to Noise Ratio and other parameters characterizing the modulation, such as the carrier frequency and the symbol rate.
Keywords :
OFDM modulation; analogue-digital conversion; OFDM; automatic digital modulation; orthogonal drequency division multiplexing modulations; parameter estimation; signal-to-noise ratio; single carrier modulations; vector signal analyzers; waveform digitizers; Amplitude modulation; Amplitude shift keying; Digital modulation; Frequency shift keying; OFDM modulation; Parameter estimation; Phase modulation; Phase shift keying; Quadrature amplitude modulation; Signal analysis; Classification; digital modulations; orthogonal frequency-division multiplexing (OFDM);
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location :
Victoria, BC
Print_ISBN :
978-1-4244-1540-3
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2008.4547269