DocumentCode
1912861
Title
Test and repair of large embedded DRAMs. I
Author
McConnell, R. ; Rajsuman, R.
Author_Institution
Infineon Technol., Munich
fYear
2001
fDate
2001
Firstpage
163
Lastpage
172
Abstract
Embedded DRAM offers major advantages in terms of system integration on-chip. However, the fabrication process requires special attention for profitable manufacturing, particularly in the area of test and repair. We present the benefits which embedded DRAM offers, and then move to test issues. We provide an analysis of the technical and financial impact of different test approaches, and discuss which considerations are important in choosing a test strategy
Keywords
DRAM chips; built-in self test; integrated circuit economics; integrated circuit testing; maintenance engineering; production testing; BIST; DRAM test issues; embedded DRAM repair; embedded DRAM test; embedded DRAMs; fabrication process; financial impact; manufacturing test; on-chip system integration; profitable manufacturing; repair; technical impact; test strategy; Automatic testing; Built-in self-test; Costs; Failure analysis; Performance evaluation; Production; Random access memory; Silicon; Software testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2001. Proceedings. International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-7169-0
Type
conf
DOI
10.1109/TEST.2001.966630
Filename
966630
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