DocumentCode
1912876
Title
[Back cover]
fYear
2012
fDate
18-22 March 2012
Abstract
Presents the back cover of the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-4673-1110-6
Electronic_ISBN
1065-2221
Type
conf
DOI
10.1109/STHERM.2012.6188875
Filename
6188875
Link To Document