• DocumentCode
    1912928
  • Title

    Framed Poly Buffer LOCOS Technology for 0.35 μm CMOS

  • Author

    Meyssen, V.M.H. ; Montrée, A.H.

  • Author_Institution
    Philips Res. Labs., Eindhoven, Netherlands
  • fYear
    1993
  • fDate
    13-16 Sept. 1993
  • Firstpage
    257
  • Lastpage
    260
  • Abstract
    An advanced isolation method, Framed Poly-Buffer LOCOS (FPBLOCOS), for a 0.35 μm CMOS technology is presented in this paper. The bird´s beak length of the FPBLOCOS isolation technique is smaller compared to the Poly Buffer LOCOS isolation scheme. Excellent thin gate oxide quality and low junction diode leakage are demonstrated. The feasibility of the isolation module was demonstrated in a 0.35 μm CMOS process where excellent device performance was achieved.
  • Keywords
    CMOS integrated circuits; oxidation; semiconductor diodes; CMOS technology; FPBLOCOS isolation; advanced isolation method; bird beak length; framed poly buffer LOCOS technology; junction diode leakage; size 0.35 mum; thin gate oxide quality; Amorphous materials; CMOS process; CMOS technology; Etching; Isolation technology; Laboratories; Leakage current; Oxidation; Scanning electron microscopy; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1993. ESSDERC '93. 23rd European
  • Conference_Location
    Grenoble
  • Print_ISBN
    2863321358
  • Type

    conf

  • Filename
    5435501