Title :
An Experimental Method for Simultaneous Extraction of Parasitic Potential Barrier Heights at Emitter-Base and Collector-Base Junctions of SIGe HBT´s
Author :
Tang, Y.T. ; Hamel, J.S.
Author_Institution :
University of Southampton, UK
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
