DocumentCode :
1913051
Title :
Improved Test Efficiency in Cores-Based System-on-Chips Using ModelSim Verification Tool
Author :
Das, Sunil R. ; Li, Jun Feng ; Hossain, Altaf ; Nayak, Amiya R. ; Petriu, Emil M. ; Biswas, Satyendra ; Jone, Wen Ben
Author_Institution :
Sch. of Inf. Technol. & Eng., Univ. of Ottawa, Ottawa, ON
fYear :
2008
fDate :
12-15 May 2008
Firstpage :
1487
Lastpage :
1492
Abstract :
Due to paradigm shift from system-on-board to designs embracing embedded cores-based system-on-chips (SOCs), the complexity of digital circuits has enormously increased in recent times. This growing complexity has created a huge challenge in developing their appropriate and efficient fault testing environment. Despite enormous efforts directed towards effective testing of very large scale integrated (VLSI) circuit chips with reasonable cost, new frontiers emerged with advances in technology. The subject paper plans to develop a method to test verify circuit architecture under a hardware software co-design environment, specifically targeting embedded cores-based system-on-chips (SOCs). The concept of design-for-testability (DFT) is utilized in the paper together with ModelSim simulation and verification tool to test simulate the entire design. Some simulation results on ISCAS 85 combinational benchmark circuits are also included with a comparison of the results with some earlier works.
Keywords :
built-in self test; design for testability; fault simulation; hardware-software codesign; logic design; logic testing; system-on-chip; ISCAS 85 combinational benchmark circuits; ModelSim verification tool; built-in self-test; design-for-testability; digital circuits; embedded core-based SOC; fault simulation; fault testing environment; hardware software co-design environment; large scale integrated circuit; system-on-chips; Circuit faults; Circuit simulation; Circuit testing; Costs; Digital circuits; Integrated circuit technology; Software testing; System testing; System-on-a-chip; Very large scale integration; Built-in self-test (BIST); Verilog HDL; embedded cores-based system-on-chips (SOCs); fault injection; fault simulation; module under test (MUT); test pattern generator (TPG);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location :
Victoria, BC
ISSN :
1091-5281
Print_ISBN :
978-1-4244-1540-3
Electronic_ISBN :
1091-5281
Type :
conf
DOI :
10.1109/IMTC.2008.4547278
Filename :
4547278
Link To Document :
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