Title :
On improving the stuck-at fault coverage of functional test sequences by using limited-scan operations
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Functional test sequences were shown to detect unique defects in VLSI circuits. This is thought to be due to the fact that they are applied at-speed. However, functional test sequences do not achieve complete stuck-at fault coverage. Therefore, scan-based stuck-at tests, as well as other types of tests, are typically also applied. This increases the amount of test resources required for test application. We describe a procedure for inserting (limited) scan operations into a functional sequence in order to improve its stuck-at fault coverage, thus reducing or eliminating the need for separate scan-based stuck-at tests. Between scan operations, the functional sequence is still applied at-speed: however, a higher stuck-at fault coverage is achieved
Keywords :
VLSI; automatic test pattern generation; digital integrated circuits; fault diagnosis; integrated circuit testing; logic testing; sequences; ATPG; VLSI circuits; at-speed testing; functional test sequences; limited-scan operations; scan operations insertion; stuck-at fault coverage improvement; Circuit faults; Circuit testing; Cities and towns; Compaction; Electrical fault detection; Fault detection; Sequential analysis; Sequential circuits; Very large scale integration;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966636
