Experimental Analysis of Laser Diode Thermal Characteristics by Voltage Transient Measurements

Author

Bagnoli, P.E. ; Piccirillo, A. ; Mottet, S. ; Thual, M. ; Oliveti, G. ; Ciampa, M.

Author_Institution

Dipt. di Ing. dell´´Inf., Univ. di Pisa, Pisa, Italy

fYear

1993

fDate

13-16 Sept. 1993

Firstpage

287

Lastpage

290

Abstract

This communication deals with a new technique for completely characterizing the equivalent thermal circuit of a laser diode and its assembling structure. This method is able to give informations about the thermal resistances and capacitances of the various parts of the whole solid composed by the laser diode, the solder layer and copper submount. Experiments performed on BRS and DFB lasers have shown the ability of the method to reveal the solder uniformity defects which cause an increase of the total thermal resistance.

Keywords

capacitance; copper; distributed feedback lasers; equivalent circuits; gold; indium; semiconductor lasers; solders; thermal resistance; Au-In-Cu; BRS lasers; DFB lasers; assembling structure; capacitances; equivalent thermal circuit; laser diode; solder layer; solder uniformity defects; thermal characteristics; thermal resistances; voltage transient measurements; Assembly; Capacitance; Circuits; Copper; Diode lasers; Electrical resistance measurement; Solids; Thermal resistance; Transient analysis; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid State Device Research Conference, 1993. ESSDERC '93. 23rd European

Conference_Location

Grenoble

Print_ISBN

2863321358

Type

conf

Filename

5435507