Title :
Source- Drain-C(V)-behaviour of short channel LDD-MOSFETs
Author :
Schuler, F. ; Hoffmann, K. ; Klein, P.
Author_Institution :
University of Bundeswehr Munich, Neubiberg, Germany
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
