Title :
A Comparison between CV and Charge-Pumping in the Extraction of MOS Interface States
Author :
Giannini, M. ; Pacelli, A. ; Perron, L.M. ; Lacaita, A.L.
Author_Institution :
Politecnico di Milano, Italy
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
