Title :
Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring
Author :
Chen, John T. ; Khare, Jitendra ; Walker, Ken ; Shaikh, Saghir ; Rajski, Janusz ; Maly, Wojciech
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This paper introduces a method that enables the diagnosis of embedded memories via test response compression and automatic bitmap recognition. The proposed method has been tested via simulation with various memory specifications, fail patterns and test algorithms; it has also been implemented in a 0.18 μm CMOS test chip
Keywords :
CMOS memory circuits; DRAM chips; SRAM chips; built-in self test; circuit simulation; failure analysis; fault location; integrated circuit manufacture; integrated circuit testing; process monitoring; production testing; 0.18 micron; BIST; CMOS test chip; DRAMs; RAM testing; SRAMs; automatic bitmap recognition; bitmap encoding; embedded memories; embedded memory diagnosis; manufacturing process monitoring; memory fail patterns; memory specifications; memory test algorithms; process monitoring; simulation; test response compression; Automatic testing; Built-in self-test; Circuit testing; Encoding; Laser feedback; Manufacturing processes; Monitoring; Pins; Production; Random access memory;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966641
