DocumentCode :
1913244
Title :
On a Simple Method for Estimating International Roughness Index Using a Profilograph
Author :
Dyer, Justin S. ; Dyer, Stephen A. ; Day, Dwight D. ; Devore, John J.
Author_Institution :
Surface Systems & Instruments, LLC, Manhattan, KS 66502 USA. E-mail: j.dyer@ieee.org
fYear :
2008
fDate :
12-15 May 2008
Firstpage :
1526
Lastpage :
1530
Abstract :
In this paper, we derive a simple method for estimating the International Roughness Index (IRI) of a pavement profile using data collected by a computerized profilograph. The algorithm presented herein achieves this by estimating the standard deviation of the point-to-point slope of the pavement from the profilograph´s recorded data and then mapping this to an expected IRI via a theoretically justified equation which we derive. We demonstrate the performance of this approach via numerical simulation and analysis.
Keywords :
Displacement measurement; Electronic mail; Nonlinear optics; Optical filters; Optical recording; Rough surfaces; State estimation; Surface roughness; Testing; Wheels; International Roughness Index; Profilograph; Uniformly minimum variance unbiased estimator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location :
Victoria, BC, Canada
ISSN :
1091-5281
Print_ISBN :
978-1-4244-1540-3
Electronic_ISBN :
1091-5281
Type :
conf
DOI :
10.1109/IMTC.2008.4547285
Filename :
4547285
Link To Document :
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