• DocumentCode
    1913355
  • Title

    Testing clock distribution circuits using an analytic signal method

  • Author

    Yamaguchi, Takahiro J. ; Soma, Mani ; Nissen, Jim ; Halter, David ; Raina, Rajesh ; Ishida, Masahiro

  • Author_Institution
    Advantest Labs. Ltd, Miyagi, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    323
  • Lastpage
    331
  • Abstract
    This paper presents an application of a new analytic signal method for measuring clock skews in the clock distribution network of microprocessors. The method can measure skews between the master system clock and distributed clocks, between two distributed clocks, or between clocks whose frequencies are related by frequency division. Experimental data using a PowerPCTM microprocessor is presented for validation
  • Keywords
    clocks; integrated circuit measurement; integrated circuit testing; microprocessor chips; synchronisation; time measurement; timing; PowerPC microprocessor; analytic signal method; clock distribution circuit testing; clock distribution network; clock frequencies; clock frequency division; clock skews; distributed clocks; master system clock; microprocessors; Circuit analysis; Circuit testing; Clocks; Crosstalk; Delay; Frequency measurement; Microprocessors; Registers; Signal analysis; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2001. Proceedings. International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7169-0
  • Type

    conf

  • DOI
    10.1109/TEST.2001.966648
  • Filename
    966648
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1913355