Title :
Testing clock distribution circuits using an analytic signal method
Author :
Yamaguchi, Takahiro J. ; Soma, Mani ; Nissen, Jim ; Halter, David ; Raina, Rajesh ; Ishida, Masahiro
Author_Institution :
Advantest Labs. Ltd, Miyagi, Japan
Abstract :
This paper presents an application of a new analytic signal method for measuring clock skews in the clock distribution network of microprocessors. The method can measure skews between the master system clock and distributed clocks, between two distributed clocks, or between clocks whose frequencies are related by frequency division. Experimental data using a PowerPCTM microprocessor is presented for validation
Keywords :
clocks; integrated circuit measurement; integrated circuit testing; microprocessor chips; synchronisation; time measurement; timing; PowerPC microprocessor; analytic signal method; clock distribution circuit testing; clock distribution network; clock frequencies; clock frequency division; clock skews; distributed clocks; master system clock; microprocessors; Circuit analysis; Circuit testing; Clocks; Crosstalk; Delay; Frequency measurement; Microprocessors; Registers; Signal analysis; Timing;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966648
