• DocumentCode
    1913415
  • Title

    Structural studies of cubic GaN films grown by MOCVD

  • Author

    Vilchis, H. ; Sánchez-R, V.M. ; Escobosa, A.

  • Author_Institution
    Electr. Eng. Dept., CINVESTA-IPN, Mexico City, Mexico
  • fYear
    2012
  • fDate
    14-17 March 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In this work the characterization of cubic GaN epitaxial films on templates obtained by nitridation of GaAs is reported. N- or p-type materials were obtained in Undoped or Mg-doped films respectively. The use of Mg compounds results in a tendency to incorporate the hexagonal phase in the films, but this effect can be avoided adjusting the experimental parameters. The results show that the materials can be suitable to the realization of optoelectronic devices.
  • Keywords
    III-V semiconductors; MOCVD; gallium arsenide; magnesium compounds; nitridation; semiconductor doping; wide band gap semiconductors; GaAs; GaN; MOCVD; Mg; cubic GaN epitaxial film; doped film; n-type material; nitridation; optoelectronic device; p-type material; structural studies; Epitaxial growth; Epitaxial layers; Gallium arsenide; Gallium nitride; Photoluminescence; Substrates; Mg doped; cubic GaN; nitridation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Devices, Circuits and Systems (ICCDCS), 2012 8th International Caribbean Conference on
  • Conference_Location
    Playa del Carmen
  • Print_ISBN
    978-1-4577-1116-9
  • Electronic_ISBN
    978-1-4577-1115-2
  • Type

    conf

  • DOI
    10.1109/ICCDCS.2012.6188897
  • Filename
    6188897