• DocumentCode
    1913703
  • Title

    Scan vs. functional testing - a comparative effectiveness study on Motorola´s MMC2107TM

  • Author

    Tumin, K. ; Vargas, Carmen ; Patterson, Ross ; Nappi, Chris

  • Author_Institution
    Motorola Embedded Control Div., Motorola Inc., Austin, TX, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    443
  • Lastpage
    450
  • Abstract
    Compares the test effectiveness of high coverage functional patterns with scan patterns for a microcontroller. Unlike previous studies, functional patterns with high coverage have been used in the comparison. Simulation fault grade and production data has been analyzed to evaluate whether scan patterns provide the same quality of coverage as functional test patterns
  • Keywords
    automatic test pattern generation; boundary scan testing; fault simulation; integrated circuit testing; logic testing; microcontrollers; timing; Motorola MMC2107; comparative effectiveness study; functional testing; high coverage functional patterns; microcontroller; production data; quality of coverage; scan patterns; simulation fault grade data; test effectiveness; Cost function; Data analysis; Failure analysis; Logic design; Logic testing; Microcontrollers; Pattern analysis; Production; Random access memory; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2001. Proceedings. International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7169-0
  • Type

    conf

  • DOI
    10.1109/TEST.2001.966661
  • Filename
    966661
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1913703