Title :
Scan vs. functional testing - a comparative effectiveness study on Motorola´s MMC2107TM
Author :
Tumin, K. ; Vargas, Carmen ; Patterson, Ross ; Nappi, Chris
Author_Institution :
Motorola Embedded Control Div., Motorola Inc., Austin, TX, USA
Abstract :
Compares the test effectiveness of high coverage functional patterns with scan patterns for a microcontroller. Unlike previous studies, functional patterns with high coverage have been used in the comparison. Simulation fault grade and production data has been analyzed to evaluate whether scan patterns provide the same quality of coverage as functional test patterns
Keywords :
automatic test pattern generation; boundary scan testing; fault simulation; integrated circuit testing; logic testing; microcontrollers; timing; Motorola MMC2107; comparative effectiveness study; functional testing; high coverage functional patterns; microcontroller; production data; quality of coverage; scan patterns; simulation fault grade data; test effectiveness; Cost function; Data analysis; Failure analysis; Logic design; Logic testing; Microcontrollers; Pattern analysis; Production; Random access memory; Test pattern generators;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966661
