مرکز منطقه ای اطلاع رساني علوم و فناوري - Investigations of the Thermal Behaviour of Low-k Dielectrics Based on Smart Designed Electromigration Lines

DocumentCode :

1913785

Title :

Investigations of the Thermal Behaviour of Low-k Dielectrics Based on Smart Designed Electromigration Lines

Author :

Ionescu, A.M. ; Mondon, F. ; Reimbold, G. ; Blachier, D. ; Arnaud, L. ; Waltz, P. ; Morand, Y.

Author_Institution :

LETI-CEA/Grenoble, France

fYear :

1998

fDate :

8-10 Sept. 1998

Firstpage :

216

Lastpage :

219

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location :

Bordeaux, France

Print_ISBN :

2-86332-234-6

Type :

conf

Filename :

1503527

Link To Document :