• DocumentCode
    1913895
  • Title

    Verification of Ethernet IP Core MAC Design Using Deterministic Test Methodology

  • Author

    Assaf, Mansour H. ; Das, Sunil R. ; Hernias, W. ; Petriu, Emil M. ; Biswas, Satyendra

  • Author_Institution
    Univ. of Trinidad & Tobago, Arima
  • fYear
    2008
  • fDate
    12-15 May 2008
  • Firstpage
    1669
  • Lastpage
    1674
  • Abstract
    The subject paper proposes an approach to developing a design verification environment targeted towards complex application-specific integrated circuits (ASICs), with particular emphasis on embedded systems incorporating intellectual property (IP) cores. An emergent trend seems to realize this through the use of coverage-driven functional verification (CDV) and reuse methodology (RM). The CDV relies on the ASIC functionalities and the verification process is formalized in the early stages of the design cycle. The deterministic testing together with the CDV and RM is applied in the paper to specifically verify the design of Ethernet IP MAC cores from open cores The Specman Elite e-language originally developed by Cadence is utilized in the process as the verification tool on representative IP core design implementations.
  • Keywords
    access protocols; application specific integrated circuits; embedded systems; industrial property; integrated circuit design; integrated circuit testing; local area networks; logic design; logic testing; Ethernet IP core MAC design; Specman Elite e-language; application-specific integrated circuits; coverage-driven functional verification; deterministic test methodology; embedded systems; intellectual property; media access control; reuse methodology; Application specific integrated circuits; Circuit testing; Computer bugs; Costs; Design engineering; Ethernet networks; Information technology; Integrated circuit testing; Intellectual property; Paper technology; Complex application-specific integrated circuits (ASICs); Ethernet intellectual property (IP) media access control (MAC) cores; Verilog; coverage-driven functional verification (CDV) and reuse methodology (RM); design under test (DUT); deterministic testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
  • Conference_Location
    Victoria, BC
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-1540-3
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2008.4547312
  • Filename
    4547312