DocumentCode
1913895
Title
Verification of Ethernet IP Core MAC Design Using Deterministic Test Methodology
Author
Assaf, Mansour H. ; Das, Sunil R. ; Hernias, W. ; Petriu, Emil M. ; Biswas, Satyendra
Author_Institution
Univ. of Trinidad & Tobago, Arima
fYear
2008
fDate
12-15 May 2008
Firstpage
1669
Lastpage
1674
Abstract
The subject paper proposes an approach to developing a design verification environment targeted towards complex application-specific integrated circuits (ASICs), with particular emphasis on embedded systems incorporating intellectual property (IP) cores. An emergent trend seems to realize this through the use of coverage-driven functional verification (CDV) and reuse methodology (RM). The CDV relies on the ASIC functionalities and the verification process is formalized in the early stages of the design cycle. The deterministic testing together with the CDV and RM is applied in the paper to specifically verify the design of Ethernet IP MAC cores from open cores The Specman Elite e-language originally developed by Cadence is utilized in the process as the verification tool on representative IP core design implementations.
Keywords
access protocols; application specific integrated circuits; embedded systems; industrial property; integrated circuit design; integrated circuit testing; local area networks; logic design; logic testing; Ethernet IP core MAC design; Specman Elite e-language; application-specific integrated circuits; coverage-driven functional verification; deterministic test methodology; embedded systems; intellectual property; media access control; reuse methodology; Application specific integrated circuits; Circuit testing; Computer bugs; Costs; Design engineering; Ethernet networks; Information technology; Integrated circuit testing; Intellectual property; Paper technology; Complex application-specific integrated circuits (ASICs); Ethernet intellectual property (IP) media access control (MAC) cores; Verilog; coverage-driven functional verification (CDV) and reuse methodology (RM); design under test (DUT); deterministic testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location
Victoria, BC
ISSN
1091-5281
Print_ISBN
978-1-4244-1540-3
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2008.4547312
Filename
4547312
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